Nanoindenter

Location: W401d

Team: SCN

Process: Measuring

*Equipment of CAiRS

Specification

The Bruker Hysitron TS 77 Select is an automated nanoindenter designed to measure the hardness and stiffness (elasticity) of materials at a microscopic level. It is a high-performance quantitative nanomechanical testing system designed to interface directly with Atomic Force Microscopes (AFMs). It converts an AFM into a platform capable of performing quantitative nanoindentation, nanoscratch, and wear testing, utilising the AFM's piezo scanner for high-resolution in-situ imaging.

Key Performance 

Driven primarily by Bruker’s patented three-plate capacitive transducer technology:

• Load (Force):
  • Maximum Force: ≥10mN (standard transducer); up to 30mN (high-load option)
  • Load Resolution: ≤1nN (typically ~0.1nN noise floor)
• Displacement (Depth):
  • Maximum Displacement: ~5μμm
  • Displacement Resolution: ≤0.04nm (typically ~0.0004nm noise floor depending on environment)

Testing Capabilities & Modes

Support several nanomechanical testing techniques:

• Quasi-static Nanoindentation: measures hardness (H) and reduced elastic modulus (E_r) of thin films and materials
• In-Situ SPM Imaging: uses the same probe tip to scan and image the surface before and after indentation. This allows for precise positioning of indents (within nanometres) and immediate post-test analysis of the deformation zone without sample transfer
• Nanoscratch and Wear (Optional): Applies a lateral force to evaluate thin film adhesion, friction coefficients, and wear resistance
• nanoDMA® III (Dynamic Mechanical Analysis - Optional): Enables depth-resolved viscoelastic properties (storage modulus, loss modulus, and tanδ) as a function of frequency