Introduction:
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the detected signal to produce an image.
Specifications:
- Sample size (max.): 25mm in diameter
- Magnification: 15X to 30,000X
- Resolution: 30 nm
- Observation condition mode: 5kV, 15kV and analysis
Notes to user:
Supplier information:
https://www.hitachi-hightech.com/global/
Equipment location:
Room HJ705 (Class 1,000)
