Skip to main content Start main content

Centre for Electron Microscopy (CEM)

CEM enables a wide variety of disciplinary and interdisciplinary research projects, covering topics from Optoelectronic to up-conversion, Ferroelectric to Pyroelectric, alloys to ceramics, polymers to biomaterials. CEM supports two transmission electron microscopes (JEOL-2011 & JEOL-2100F) providing bright field image, select area diffraction, annular dark field STEM, phase contrast high resolution electron microscopy, holography, electron energy loss spectroscopy, EDS. a dual beam focused ion beam (FIB) microscope (JIB-4501) with EBL-NPGS providing pattern writing and sample preparation, as well as an instrumentation for TEM sample preparation (PIPS-691).


Your browser is not the latest version. If you continue to browse our website, Some pages may not function properly.

You are recommended to upgrade to a newer version or switch to a different browser. A list of the web browsers that we support can be found here