The semiconductor parameters testing system

Introduction:

This system consists of three modules: a KEITHLEY 4200A semiconductor parameters analyser, a room temperature probe platform, and a Lake Shore PS-100 variable temperature test module.

Specifications:

• A medium power testing unit (4200-SMU);
• A high power testing unit (4210-SMU);
• Two sets of current preamplifiers (4200-PA).

Notes to users:

Users should be trained before operation.

Booking:

Please contact equipment-in-charge Mr. Lin ZOU for booking enquiry.

Contact information:

Location: Lab 610, Building R2-A, The Hong Kong Polytechnic University Shenzhen Research Institute (PolyU SZRI)

Equipment-in-charge: Mr. Lin ZOU 

E-mail: lin.zou@polyu.edu.hk