Prof. Zhang Yi and his international research team have earned 2024 Best Paper Awards from two flagship IEEE journals, recognizing groundbreaking work in power electronics.
The first award-winning paper, "A Sparsity-Promoting Time-Domain Evaluation Method for Thermal Transient Measurement of Power Semiconductors," published in IEEE Transactions on Power Electronics, introduces a novel algorithm that improves measurement resolution tenfold. Developed with RWTH Aachen University and Aalborg University, this innovation advances thermal analysis for high-efficiency energy systems and electric vehicles.
The second recognized paper, "Guideline for Reproducible SiC MOSFET Thermal Characterization based on Source-Drain Voltage," published in IEEE Transactions on Industry Applications, establishes the first reproducible thermal testing standards for silicon carbide power transistors. This collaborative work with Aalborg University, Southwest Jiaotong University (China), Siemens, and Tesla sets new reliability benchmarks for electric vehicle and renewable energy systems.
These dual awards highlight the team's significant contributions to power electronics research and development and Prof. Zhang's pioneering leadership.
