CEM enables a wide variety of disciplinary and interdisciplinary research projects, covering topics from optoelectronics to up-conversion, ferroelectrics to pyroelectrics, alloys to ceramics, and polymers to biomaterials. CEM supports two transmission electron microscopes (JEOL-F200 & JEOL-2100F) providing bright field and dark field STEM, selected area electron diffraction, convergent beam electron diffraction, nanobeam electron diffraction, phase-contrast high-resolution electron microscopy, electron holography, electron energy loss spectroscopy, and EDS, as well as instrumentation for TEM sample preparation (PIPS-691).