Introduction:
Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.
Applications:
- Ultra-low-energy, inert-gas ion source
- Concentrated ion beam with scanning capabilities
- Removes damaged layers without redeposition
- Ideal for post-focused ion beam processing
- Enhances the results from conventionally prepared specimens
- Room temperature to cryogenically cooled NanoMilling SM process
- Rapid specimen exchange for high- throughput applications
- Computer-controlled, fully programmable, and easy to use
- Contamination-free, dry vacuum system
Notes to users:
Supplier information:
https://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill®-tem-specimen-preparation-system
Please click here to download the equipment introduction poster.
Equipment location:
Room W205
