Skip to main content Start main content

Precision metrology: Beyond Bulk Optics – A perspective

Distinguished Research Seminar Series

20240409Prof Dame Jane JiangDRSSISE Website Event Image2
  • Date

    09 Apr 2024

  • Organiser

    Department of Industrial and Systems Engineering, PolyU

  • Time

    09:30 - 11:00

  • Venue

    AG710  

Speaker

Prof. Dame Jane Jiang

20240409Prof Dame Jane JiangDRSSISE Websiteposter2

Summary

The evolution of high value manufacturing is being driven by a technological move to smart and sustainable manufacturing processes. Central to this transition are the combination of two technologies: digital twins which are used to virtualise underlying physical processes; and machine learning which can enhance process control and decision-making. A fundamental requirement of these technologies is real-time data, acquired during each stage of a manufacturing process chain. The need for high data-acquisition rates, sensitivity and non-contact operation are broadly satisfied by modern optical sensors, but sensor integration and cost remain persistent challenges that difficult to address using conventional (bulk) optical systems.
Metasurfaces, artificially structured surfaces covered in sub-wavelength elements, provide a way in which amplitude, phase, and polarisation light can be precisely manipulated, but without the size and weight required by traditional optical components. In addition, metasurfaces can be manufactured on membranes or thin substrates and by modifying the size and shape of the individual elements across a surface, different functionalities can be realised.

This talk will report on recent developments of metasurfaces for precision metrology applications and outline how photonic metasurfaces have the potential to revolutionise optical sensor technology by supporting sensor integration through miniaturisation and enhanced functionality. Finally, we discuss some of the challenges for harnessing photonic metasurface as engineered components in real-world systems and articulate the research challenges and opportunities for future precision metrology.

 

Keynote Speaker

Prof. Dame Jane Jiang

Prof. Dame Jane Jiang

Department of Engineering and Technology
School of Computing and Engineering
Centre of Precision Technologies
University of Huddersfield

Professor Dame Jane Jiang holds a Royal Academy of Engineering/Renishaw Chair in Precision Metrology, the Director of the UK Future/Sustainable Metrology Hub and the Chief Scientist, Centre of Precision Technologies, University of Huddersfield. Jane obtained her PhD in measurement science, Huazhong University of Science and Technology, China in 1995; a DSc for precision engineering, University of Huddersfield in 2007; and received an honorary HDSc from City, University of London in 2019. She is an internationally respected research leader in advanced metrology, with a background in both industry and academia, particularly interested in modelling non-Euclidean geometries, artificial intelligence ready characterisation technologies, and nanophotonics-enabled optical sensors and instruments. She has published more than 550 papers, books, and patents, and has been awarded £ 40M research grants including EPSRC Strategic and Programme, and ERC Advanced Grants and industrial fundings. She has intensively worked with industries and transferred many research outputs into industrial products and ISO standards. She is a Fellow of the Royal Academy of Engineering, International Academy of Production Research (Collège International pour la Recherche en Productique, CIRP) and Institute of Engineering Technology. She is member of UK Engineering Physical Science Research Council (EPSRC), a Member of Science, Engineering and Technology Board of EPSRC, and member of the Science Board of the Science and Technology Facility Council. She received Royal Society Wolfson Research Merit Award 2006, Sir Harold Hartley Medal 2014, a Damehood in 2017 for services to Manufacturing and Engineering and she is the leading recipient of the Queen's Anniversary Prizes for Advanced Metrology 2021.  

Your browser is not the latest version. If you continue to browse our website, Some pages may not function properly.

You are recommended to upgrade to a newer version or switch to a different browser. A list of the web browsers that we support can be found here