ISE innovations honoured internationally at the 50th International Exhibition of Inventions of Geneva

Project:

Surface Sampling and Packing System for Chang’e-5 and -6 Lunar Sample Return Missions

Award:

Saudi Innovation Excellence Prize - Ministry of Education

Gold Medal with Congratulations of the Jury

Principal Investigator:

Prof. YUNG Kai Leung

Director of Research Centre for Deep Space Explorations; Sir Sze-yuen Chung Professor in Precision Engineering; Chair Professor of Precision Engineering and Associate Head of Department of Industrial and Systems Engineering

Details:

Prof. Yung and his team, in collaboration with the China Academy of Space Technology, has developed a groundbreaking “Surface Sampling and Packing System” for the historic national Chang’e-5 and Chang’e-6’s Lunar Sample Missions to perform lunar surface sampling and packaging. Unlike previous methods relying on drilling or manual excavation, this fully automated system enables multi-point surface sampling and precise packaging. It consists of a pair of samplers, high-temperature Near-field Cameras for sample collection and vision-guided sampling, sample deposition, sample container pickup and precision container placement into the ascender, as well as a Packaging and Sealing Station for primary packaging and sealing of collected sample. Deployed on the Chang’e-5 and Chang’e-6 landers, the system successfully collected over 1.5 kg of surface samples from the lunar front side and 1.6 kg from the far side, marking the first-ever lunar far-side surface sampling. Various space-qualified models, including Engineering, Test, Qualifying, and Flight Models, were developed to ensure high-precision sampling and automated in-situ packaging into an Earth return capsule. This pioneering technology represents a significant advancement in lunar exploration.

Project:

Multi-mode Optical Characterisation Interferometer (MOCI)

Award:

Gold Medal

Principal Investigator:

Prof. CHEUNG Chi-fai Benny

Chair Professor of Ultra-precision Machining and Metrology, Department of Industrial and Systems Engineering; Director, State Key Laboratory of Ultra-precision Machining Technology

Details:

Optical characterisation is essential for determining whether an optical system or element meets specific performance requirements. This process has wide applications in various industrial fields. However, many existing optical characterisation instruments can only measure individual optical parameters for specific industrial fields.

This invention introduces a novel multi-mode optical characterisation interferometer (MOCI). Based on wavefront and shear interferometry measurement principles, the MOCI uses light wavefronts to determine the optical properties of materials. These properties affect the functional performance of an optical system or element.

The MOCI offers versatile measurement capabilities, allowing it to evaluate multiple optical properties in a single instrument. It can be used across different applications, including power maps, cylindrical distribution, and astigmatism axis for optometry products including myopia defocus spectacle lenses. Additionally, it assesses phase distributions, reflective index and modulation transfer function for metastructures, and evaluates the surface roughness and flatness of wafers for semiconductor applications.