Field Emission Electron Microscope STEM (JEOL Model JEM-2100F)
The JEM-2100F is a multipurpose 200 Kev FE (field emission) analytical electron microscope. The FE electron gun (FEG) produces highly stable and bright electron probe. This feature is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample. Various analytical instruments such as EDS (Energy Dispersive X-ray Spectrometer), electron holography, EELS (electron energy loss spectrometer), and CCD camera are integrated.
- Dark Field Image
- Bright Field Image
- Electron Holography
- Selected Area Electron Diffraction
- High Resolution Electron Microscopy
- High-Angle Annular Dark-Field Image
- Electron Energy Loss Spectroscopy (EELS)
- Energy Dispersive X-ray Spectroscopy (EDS)
- Energy Dispersive X-ray Spectroscopy Mapping
Notes to users:
Inexperience users of the TEM are required to get training from the laboratory supervisor. Any first-time user of PolyU-CEM is required to be trained for microscopy skills.
Specimens should ideally be less than 100nm in thickness, prepared carefully to minimize specimen contamination.
Please click here to download the equipment introduction poster.